High Voltage Metrology with Collinear Laser Spectroscopy

Clicks: 203
ID: 116531
2018
Reference Key
nörtershäuser20182018high Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Jorg Kramer,Kristian Konig,Christopher Geppert,Phillip Imgram,Bernhard Maab,Johann Meisner,Ernst Wilhelm Otten,Stephan Passon,Tim Ratajczyk,Johannes Ullmann,W. Nörtershäuser;Jorg Kramer;Kristian Konig;Christopher Geppert;Phillip Imgram;Bernhard Maab;Johann Meisner;Ernst Wilhelm Otten;Stephan Passon;Tim Ratajczyk;Johannes Ullmann;W. Nörtershäuser;
Journal 2018 conference on precision electromagnetic measurements (cpem 2018)
Year 2018
DOI 10.1109/cpem.2018.8501251
URL
https://sciprofiles.com/publication/view/9f24323c7f83bb1f8266f6f86f8256e3
Keywords
uncertainty ions voltage measurement laser excitation high-voltage techniques frequency measurement measurement by laser beam

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