Electromagnetic separation of coarse Al–Si melts: The migration behavior of iron-rich phase and continuous growth of primary silicon
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ID: 81400
2020
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xiao2020electromagneticjournal
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| Authors | Xiao, T. |
| Journal | journal of alloys and compounds |
| Year | 2020 |
| DOI | 10.1016/j.jallcom.2019.153006 |
| URL | |
| Keywords | Keywords not found |
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