The MIVD method of optimal seeding state detection using image processing technology for sapphire crystal growth via the Kyropoulos method
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ID: 82957
2020
Reference Key |
liu2020themeasurement
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Authors | Liu, Y. |
Journal | measurement: journal of the international measurement confederation |
Year | 2020 |
DOI | 10.1016/j.measurement.2019.107186 |
URL | |
Keywords | Keywords not found |
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