Interface passivation to overcome shunting in semiconductor-catalyst junctions.

Clicks: 212
ID: 91919
2020
High-performance mesoporous hematite photoanodes modified with a conductive water oxidation catalyst, Ni0.75Fe0.25OxHy, for photoelectrochemical water oxidation are limited by shunting. We present a general method to overcome shunting via the selective electrodeposition of a thin poly(phenylene oxide) (PPO) insulating layer onto the exposed transparent conductive oxide substrate following catalyst deposition.
Reference Key
shadabipour2020interfacechemical Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Shadabipour, Parisa;Hamann, Thomas W;
Journal Chemical communications (Cambridge, England)
Year 2020
DOI 10.1039/c9cc09597g
URL
Keywords

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

No comments yet. Be the first to comment on this article.